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StéréoPhotométrie: The roughness measuring software

Reference

05413-01

Patents status

IDDN.FR.001.520009.000.S.P.2012.000.21000

Inventors

Majdi KHOUDEIR
Benjamin BRINGIER
Philippe DUBOIS

commercial status

Licence of use or exploitation licence Collaborative research

Laboratory

XLIM, CNRS, France.

Description

TECHNICAL DESCRIPTION

The XLIM-SIC laboratory is specialized in surface analysis by image processing.

The scientists have invented and developed software that manages the acquisition and analysis of series of images to obtain quickly the different characteristics of a surface, such as 3D cartography, roughness or colorimetry. To achieve this result, two methods are available:

BENEFITS

  • Local relief extraction
  • Faster calculation speeds (operation in less than 1 minute)
  • Ease of implementation
  • Low operating costs

INDUSTRIAL APPLICATIONS

  • Skin analysis
  • Surface treatment analysis
  • Colorimetric analysis

For further information, please contact us (Ref 05413-01)

 


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