CNRS Technologies

Find the best CNRS technologies to boost your innovative project.

Les brevets les plus récents

You are a research scientist?

We can guide you through the whole technology transfer process.

See all our services

You are a corporate player?

Thanks to our expertise, our network and our know-how of the innovation ecosystem, we support you throughout your project.

Contact us

Follow our news and upcoming events

Discover CNRS technologies

Meet our team

Fermer

StéréoPhotométrie: The roughness measuring software

Référence

05413-01

Statut des brevets

IDDN.FR.001.520009.000.S.P.2012.000.21000

Inventeurs

Majdi KHOUDEIR
Benjamin BRINGIER
Philippe DUBOIS

Statut commercial

Licence of use or exploitation licence Collaborative research

Laboratoire

XLIM, CNRS, France.

Description

TECHNICAL DESCRIPTION

The XLIM-SIC laboratory is specialized in surface analysis by image processing.

The scientists have invented and developed software that manages the acquisition and analysis of series of images to obtain quickly the different characteristics of a surface, such as 3D cartography, roughness or colorimetry. To achieve this result, two methods are available:

BENEFITS

  • Local relief extraction
  • Faster calculation speeds (operation in less than 1 minute)
  • Ease of implementation
  • Low operating costs

INDUSTRIAL APPLICATIONS

  • Skin analysis
  • Surface treatment analysis
  • Colorimetric analysis

For further information, please contact us (Ref 05413-01)

 


Besoin de plus d'informations ?

Nous contacter
Fermer

Contactez-nous

  • This field is for validation purposes and should be left unchanged.
Fermer

Les brevets les plus récents