TECHNICAL DESCRIPTION

The invention describes a device to analyse in one shot X-Ray diffraction or scattering pattern that includes:
– an X-Ray generator;
– a new bidimensionnal analyzer permitting chromatic and angular filtering;
– a 1D or 2D X-Ray detection mean (CCD, …).

ADVANTAGES

– Easy measurements on-site (no angular scan, no mobile element);
– Very good Signal/Noise ratio (enhancement of the detected signal intensity; possibility to offset fluorescence or inelastic scattering or environmental noises);
– Selection of the source zone to analyse;
– Better sampling of the analysed object.

INDUSTRIAL APPLICATIONS

This innovation was developed for X-Ray diffraction and scattering and can be also used for fluorescence or imaging applications. (powder analysis, crystallography …).