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30.01.2020
11827-01
06.11.2018
Materials – Coating 07293-01
06.11.2018
Materials – Coating 10581-01
06.11.2018
Chemistry / Environment 08758-01
06.11.2018
11127-01
06.11.2018
Environment and Energy 11107-01
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01212-01
French patent application FR0703161 filed on: 5/2/2007 and entitled: “Sonde pour microscopie à force atomique”
Marc FAUCHER
Lionel BUCHAILLOT
Jean-Pierre AIME
Bernard LEGRAND
Gérard COUTURIER
Research agreement, exclusive or non exclusive licenses
Institut d’électronique, de microélectronique et de nanotechnologie (IEMN, UMR8520), Lille, France.
The invention concerns a probe for atomic force microscopy with a micromechanical resonator and a tip for atomic force microscopy projecting said resonator, wherein it also includes a way to selectively excite a swing that volume resonator, and in that the peak for atomic force microscopy that protrudes significantly resonator matching a ventral of that mode of oscillation of volume.
The most important benefit arising from the use of modes of oscillation is the volume decrease in losses Hydrodynamical uses liquid.
The probe can be used in an atomic force microscope which is particularly suited for insulating materials, semiconductors, and biological samples.
30.07.2015
Devices & Instruments 03215-01
02.06.2015
Devices & Instruments 04958-01
18.02.2014
Devices & Instruments 05413-01
30.01.2020
11827-01
06.11.2018
Materials – Coating 07293-01
06.11.2018
Materials – Coating 10581-01
06.11.2018
Chemistry / Environment 08758-01
06.11.2018
11127-01
06.11.2018
Environment and Energy 11107-01