Probe for atomic force microscope
Reference
01212-01
Keywords
Patents status
French patent application FR0703161 filed on: 5/2/2007 and entitled: “Sonde pour microscopie à force atomique”
Inventors
Marc FAUCHER
Lionel BUCHAILLOT
Jean-Pierre AIME
Bernard LEGRAND
Gérard COUTURIER
commercial status
Research agreement, exclusive or non exclusive licenses
Laboratory
Institut d’électronique, de microélectronique et de nanotechnologie (IEMN, UMR8520), Lille, France.
Description
TECHNICAL DESCRIPTION
The invention concerns a probe for atomic force microscopy with a micromechanical resonator and a tip for atomic force microscopy projecting said resonator, wherein it also includes a way to selectively excite a swing that volume resonator, and in that the peak for atomic force microscopy that protrudes significantly resonator matching a ventral of that mode of oscillation of volume.
BENEFITS
The most important benefit arising from the use of modes of oscillation is the volume decrease in losses Hydrodynamical uses liquid.
INDUSTRIAL APPLICATIONS
The probe can be used in an atomic force microscope which is particularly suited for insulating materials, semiconductors, and biological samples.
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