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Probe for atomic force microscope

Reference

01212-01

Patents status

French patent application FR0703161 filed on: 5/2/2007 and entitled: “Sonde pour microscopie à force atomique”

Inventors

Marc FAUCHER
Lionel BUCHAILLOT
Jean-Pierre AIME
Bernard LEGRAND
Gérard COUTURIER

commercial status

Research agreement, exclusive or non exclusive licenses

Description

TECHNICAL DESCRIPTION

The invention concerns a probe for atomic force microscopy with a micromechanical resonator and a tip for atomic force microscopy projecting said resonator, wherein it also includes a way to selectively excite a swing that volume resonator, and in that the peak for atomic force microscopy that protrudes significantly resonator matching a ventral of that mode of oscillation of volume.

BENEFITS

The most important benefit arising from the use of modes of oscillation is the volume decrease in losses Hydrodynamical uses liquid.

INDUSTRIAL APPLICATIONS

The probe can be used in an atomic force microscope which is particularly suited for insulating materials, semiconductors, and biological samples.


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