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Out of plane measurements of material strain

Reference

85431-01

Patents status

French patent application FR0208969 filed on July 16, 2002 and entitled “Dispositif pour mesurer des variations dans le relief d’un objet”

Inventors

J. BRILLAUD
F. LAGATTU

commercial status

Exclusive or non-exclusive licenses and collaborative research.

Laboratory

Laboratoire de mécanique et de physique des matériaux (LMPM, UMR6617), Chasseneuil du Poitou, France.

Description

TECHNICAL DESCRIPTION

This invention provides the measurement of out of plane displacement in objects during mechanical tests without contact.

The analyzed section is usually 15×20 mm2.

The resolution of the measurement is 1 to 2 µm on a large range of gradients (10-3 to 10-1).

An accurate map of the whole surface can be obtained quickly (from a few seconds to a few minutes according to the number of points to be treated).

INDUSTRIAL APPLICATIONS

To measure deformation of an object out of the plane to obtain material constitutive laws, for example.
Use as a “profilometer” is possible

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