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Device for electromagnetic characterization of a tested structure

Référence

84766-01

Statut des brevets

French patent application FR2817620 filed on December 4, 2000 entitled “Dispositif de caracérisation électromagnétique d’une structure sous test”

Inventeurs

Bernard JECKO
Michèle LALANDE-GUIONIE
Edson MARTINOD
Alain REINEIX

Statut commercial

Exclusive or non-exclusive licenses and collaborative research

Laboratoire

XLIM, a CNRS and « Université de Limoges » laboratory (UMR6172) in Limoges, France.

Description

TECHNICAL DESCRIPTION

This invention describes an innovative device for electromagnetic characterization of a test structure. The predetermined frequency bands of the distribution parameters of the structure as well as its spurious rays are evaluated. The structure includes an electric signal generator and the means to transmit the signals to the structure being tested. The following can also be analysed:
– The signal being reflected by the structure,
– The signal transmitted by the generator.
The electric signal generator is pulse generated such that its spectrum is at least as broad as the predetermined frequency band.

INDUSTRIAL APPLICATIONS

Pulse metrology is a leading edge technology. This innovation measures electromagnetic characteristics with a simple device and is less expensive than current techniques, such as the anechoic chamber. Potential non-military applications include testing car antennae, for example.

For further information, please contact us (Ref 84766-01)


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